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Detection of faults in resistive coatings with an impedance-tomography-related approach.

Authors :
Vilhunen, T.
Heikkinen, L. M.
Savolainen, T.
Vauhkonen, P. J.
Lappalainen, R.
Kaipio, J. P.
Vauhkonen, M.
Source :
Measurement Science & Technology; Jun2002, Vol. 13 Issue 6, p1-1, 1p
Publication Year :
2002

Details

Language :
English
ISSN :
09570233
Volume :
13
Issue :
6
Database :
Complementary Index
Journal :
Measurement Science & Technology
Publication Type :
Academic Journal
Accession number :
98007551
Full Text :
https://doi.org/10.1088/0957-0233/13/6/306