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Generalised adjoint simulation of induced signals in semiconductor X-ray pixel detectors.

Authors :
Kreisler, B.
Durst, J.
Michel, T.
Anton, G.
Source :
Journal of Instrumentation; Nov2008, Vol. 3 Issue 11, p1-1, 1p
Publication Year :
2008

Details

Language :
English
ISSN :
17480221
Volume :
3
Issue :
11
Database :
Complementary Index
Journal :
Journal of Instrumentation
Publication Type :
Academic Journal
Accession number :
97680772
Full Text :
https://doi.org/10.1088/1748-0221/3/11/P11002