Study of Defect-Layers Effect in Ferroelectric Thin Film with Transverse Ising Model.

Details

Language :

English

ISSN :

02536102

Volume :

56

Issue :

6

Database :

Complementary Index

Journal :

Communications in Theoretical Physics

Publication Type :

Periodical

Accession number :

97621781

Full Text :

https://doi.org/10.1088/0253-6102/56/6/15