A reliable TDDB lifetime Projection model for advanced gate stack.

Authors :: Chen, S. C.
Chen, C. L.
Lee, Y.-H.
Chang, S. W.
Shih, J. R.
Lee, Y. W.
Maji, D.
Wu, K.
Source :: 2013 IEEE International Integrated Reliability Workshop Final Report; 2013, p102-105, 4p
Publication Year :: 2013

Language :: English
ISBNs :: 9781479903528
Database :: Complementary Index
Journal :: 2013 IEEE International Integrated Reliability Workshop Final Report
Publication Type :: Conference
Accession number :: 97031381
Full Text :: https://doi.org/10.1109/IIRW.2013.6804169