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5.1: Invited Paper: Degradation Analysis of Light Emitting Diodes by Time Resolved Photoluminescence Measurements.

Authors :
Murata, Hideyuki
Sandanayaka, Atula S. D.
Source :
SID Symposium Digest of Technical Papers; Jun2014, Vol. 45 Issue 1, p32-35, 4p
Publication Year :
2014

Abstract

We demonstrate that the degradation in Alq<subscript>3</subscript>-based OLEDs is caused by the photophysical degradation processes of α-NPD and Alq<subscript>3</subscript> molecules in the vicinity of the α-NPD/Alq<subscript>3</subscript> interface. Two degradation pathways with different time constants take place during a decrease in electroluminescence under constant current operation. From time resolved photoluminescence measurements, we identify the first stage of the degradation is due to the decomposition of α-NPD molecules via the singlet excited states formed by recombining charge carriers. The second stage of the degradation is attributed to the formation of a luminescent quencher originated from the reaction of excited state of Alq<subscript>3</subscript>. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0097966X
Volume :
45
Issue :
1
Database :
Complementary Index
Journal :
SID Symposium Digest of Technical Papers
Publication Type :
Academic Journal
Accession number :
96937391
Full Text :
https://doi.org/10.1002/j.2168-0159.2014.tb00009.x