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5.1: Invited Paper: Degradation Analysis of Light Emitting Diodes by Time Resolved Photoluminescence Measurements.
- Source :
- SID Symposium Digest of Technical Papers; Jun2014, Vol. 45 Issue 1, p32-35, 4p
- Publication Year :
- 2014
-
Abstract
- We demonstrate that the degradation in Alq<subscript>3</subscript>-based OLEDs is caused by the photophysical degradation processes of α-NPD and Alq<subscript>3</subscript> molecules in the vicinity of the α-NPD/Alq<subscript>3</subscript> interface. Two degradation pathways with different time constants take place during a decrease in electroluminescence under constant current operation. From time resolved photoluminescence measurements, we identify the first stage of the degradation is due to the decomposition of α-NPD molecules via the singlet excited states formed by recombining charge carriers. The second stage of the degradation is attributed to the formation of a luminescent quencher originated from the reaction of excited state of Alq<subscript>3</subscript>. [ABSTRACT FROM AUTHOR]
- Subjects :
- ORGANIC light emitting diodes
PHOTOLUMINESCENCE
OPTICS
MOLECULES
DIODES
Subjects
Details
- Language :
- English
- ISSN :
- 0097966X
- Volume :
- 45
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- SID Symposium Digest of Technical Papers
- Publication Type :
- Academic Journal
- Accession number :
- 96937391
- Full Text :
- https://doi.org/10.1002/j.2168-0159.2014.tb00009.x