Back to Search
Start Over
X-ray Full Field Microscopy at 30 keV.
- Source :
- Journal of Physics: Conference Series; 2014, Vol. 499 Issue 1, p012007-012012, 6p
- Publication Year :
- 2014
Details
- Language :
- English
- ISSN :
- 17426588
- Volume :
- 499
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- Journal of Physics: Conference Series
- Publication Type :
- Academic Journal
- Accession number :
- 95551690
- Full Text :
- https://doi.org/10.1088/1742-6596/499/1/012007