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X-ray diffraction study of the crystallographic characteristics of TlInSSe solid solutions.

Authors :
Sheleg, A.
Hurtavy, V.
Shautsova, V.
Aliev, V.
Source :
Crystallography Reports; Mar2014, Vol. 59 Issue 2, p186-189, 4p
Publication Year :
2014

Abstract

Crystallographic parameters of TlInSSe solid solutions have been measured by X-ray diffraction. Dependences of the unit-cell parameters on the composition are determined. It is established that the values of parameters a, b, and c and the angle β decrease with an increase in x. It is shown that the TlInSSe system includes a continuous series of solid solutions based on the TlInSe compound with tetragonal symmetry at x values ≤ 0.4, while at x ≥ 0.6 solid solutions based on the TlInS compound with a monoclinic structure are formed. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10637745
Volume :
59
Issue :
2
Database :
Complementary Index
Journal :
Crystallography Reports
Publication Type :
Academic Journal
Accession number :
95109148
Full Text :
https://doi.org/10.1134/S1063774514020229