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C-Si surface passivation by aluminum oxide studied with electron energy loss spectroscopy.

Authors :
Hoex, Bram
Bosman, Michel
Nandakumar, Naomi
Kessels, W.M.M.
Source :
2013 IEEE 39th Photovoltaic Specialists Conference (PVSC); 2013, p3333-3336, 4p
Publication Year :
2013

Details

Language :
English
Database :
Complementary Index
Journal :
2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)
Publication Type :
Conference
Accession number :
95078845
Full Text :
https://doi.org/10.1109/PVSC.2013.6745164