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Migration effects at conductor / XLPE interface subjected to partial discharges at different electrical stresses.

Authors :
Florkowski, M.
Florkowska, B.
Roehrich, J.
Rybak, A.
Zydron, P.
Source :
2013 Annual Report Conference on Electrical Insulation & Dielectric Phenomena; 2013, p1189-1192, 4p
Publication Year :
2013

Details

Language :
English
ISBNs :
9781479925971
Database :
Complementary Index
Journal :
2013 Annual Report Conference on Electrical Insulation & Dielectric Phenomena
Publication Type :
Conference
Accession number :
95075117
Full Text :
https://doi.org/10.1109/CEIDP.2013.6748248