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Memristor: Part II–DC, Transient, and RF Analysis.

Authors :
Mazady, Anas
Anwar, Mehdi
Source :
IEEE Transactions on Electron Devices; Apr2014, Vol. 61 Issue 4, p1062-1070, 9p
Publication Year :
2014

Abstract

The dc and RF circuit performance of memristor circuits, including transient behavior, is developed by considering current contributions arising from different conduction mechanisms, namely, filament-assisted and bulk tunneling currents and currents flowing through low and high conductivity filaments. The dc circuit model explains the observed I-V hysteresis and most importantly allows scaling and optimization. A transient circuit model of memristive system is developed, based upon the dynamics, incorporating underlying electrochemistry that suggests SET and RESET transitions for a 50-nm TiO2-based memristor take approximately 120 ps to stabilize. A faster READ/WRITE operation would require appropriate conditioning circuitry. RF analysis suggests for a maximum allowable frequency of 7.5 GHz beyond which memristors can no longer be used as RRAM. These values can be pushed to higher limits by increasing the device cross-sectional area or choosing lower permittivity materials. The developed model allows its incorporation in commercial circuit simulators. The derived model is validated by incorporating it in Chua's chaotic circuit. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
00189383
Volume :
61
Issue :
4
Database :
Complementary Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
95069176
Full Text :
https://doi.org/10.1109/TED.2014.2304639