Back to Search
Start Over
Controlling coverage of solution cast materials with unfavourable surface interactions.
- Source :
- Applied Physics Letters; 3/3/2014, Vol. 104 Issue 9, p1-5, 5p, 1 Black and White Photograph, 3 Graphs
- Publication Year :
- 2014
-
Abstract
- Creating uniform coatings of a solution-cast material is of central importance to a broad range of applications. Here, a robust and generic theoretical framework for calculating surface coverage by a solid film of material de-wetting a substrate is presented. Using experimental data from semiconductor thin films as an example, we calculate surface coverage for a wide range of annealing temperatures and film thicknesses. The model generally predicts that for each value of the annealing temperature there is a range of film thicknesses leading to poor surface coverage. The model accurately reproduces solution-cast thin film coverage for organometal halide perovskites, key modern photovoltaic materials, and identifies processing windows for both high and low levels of surface coverage. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 104
- Issue :
- 9
- Database :
- Complementary Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 94854329
- Full Text :
- https://doi.org/10.1063/1.4867263