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A New Method for Measuring Properties of Dielectric Materials Using a Microstrip Cavity (Short Papers).

Authors :
Itoh, T.
Source :
IEEE Transactions on Microwave Theory & Techniques; 1974, Vol. 22 Issue 5, p572-576, 5p
Publication Year :
1974

Details

Language :
English
ISSN :
00189480
Volume :
22
Issue :
5
Database :
Complementary Index
Journal :
IEEE Transactions on Microwave Theory & Techniques
Publication Type :
Academic Journal
Accession number :
93189480
Full Text :
https://doi.org/10.1109/TMTT.1974.1128287