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Selecting the most reliable design under type-II censored accelerated testing.

Selecting the most reliable design under type-II censored accelerated testing.

Authors :
Chang, D.-S.
Huang, D.-Y.
Tseng, S.-T.
Source :
IEEE Transactions on Reliability; 1992, Vol. 41 Issue 4, p588-592, 5p
Publication Year :
1992

Details

Language :
English
ISSN :
00189529
Volume :
41
Issue :
4
Database :
Complementary Index
Journal :
IEEE Transactions on Reliability
Publication Type :
Academic Journal
Accession number :
93153803
Full Text :
https://doi.org/10.1109/24.249592