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Electronic System Thermal Design for Reliability.

Authors :
Hannemann, R.
Source :
IEEE Transactions on Reliability; 1977, Vol. R-26 Issue 5, p306-310, 5p
Publication Year :
1977

Details

Language :
English
ISSN :
00189529
Volume :
R-26
Issue :
5
Database :
Complementary Index
Journal :
IEEE Transactions on Reliability
Publication Type :
Academic Journal
Accession number :
93151065
Full Text :
https://doi.org/10.1109/TR.1977.5220180