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Permanent Damage Produced by Single Proton Interactions in Silicon Devices.
- Source :
- IEEE Transactions on Nuclear Science; 1986, Vol. 33 Issue 6, p1597-1604, 8p
- Publication Year :
- 1986
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 33
- Issue :
- 6
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 93146017
- Full Text :
- https://doi.org/10.1109/TNS.1986.4334648