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Gamma-Induced Leakage in Junction Field-Effect Transistors.
- Source :
- IEEE Transactions on Nuclear Science; 1984, Vol. 31 Issue 6, p1487-1491, 5p
- Publication Year :
- 1984
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 31
- Issue :
- 6
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 93144414
- Full Text :
- https://doi.org/10.1109/TNS.1984.4333535