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CMOS RAM Cosmic-Ray-Induced-Error-Rate Analysis.

Authors :
Pickel, J. C.
Blandford, J. T.
Source :
IEEE Transactions on Nuclear Science; 1981, Vol. 28 Issue 6, p3962-3967, 6p
Publication Year :
1981

Details

Language :
English
ISSN :
00189499
Volume :
28
Issue :
6
Database :
Complementary Index
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
93142259
Full Text :
https://doi.org/10.1109/TNS.1981.4335656