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CMOS RAM Cosmic-Ray-Induced-Error-Rate Analysis.
- Source :
- IEEE Transactions on Nuclear Science; 1981, Vol. 28 Issue 6, p3962-3967, 6p
- Publication Year :
- 1981
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 28
- Issue :
- 6
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 93142259
- Full Text :
- https://doi.org/10.1109/TNS.1981.4335656