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Electric Field Strength Dependence of Surface Damage in Oxde Passivated Silicon Planar Transistors.
- Source :
- IEEE Transactions on Nuclear Science; 1970, Vol. 17 Issue 6, p18-26, 9p
- Publication Year :
- 1970
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 17
- Issue :
- 6
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 93135898
- Full Text :
- https://doi.org/10.1109/TNS.1970.4325762