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Electric Field Strength Dependence of Surface Damage in Oxde Passivated Silicon Planar Transistors.

Authors :
Goben, C. A.
Irani, C. H.
Source :
IEEE Transactions on Nuclear Science; 1970, Vol. 17 Issue 6, p18-26, 9p
Publication Year :
1970

Details

Language :
English
ISSN :
00189499
Volume :
17
Issue :
6
Database :
Complementary Index
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
93135898
Full Text :
https://doi.org/10.1109/TNS.1970.4325762