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A new I-V model for short gate-length MESFET's.

Authors :
Chin, S.-P.
Wu, C.-Y.
Source :
IEEE Transactions on Electron Devices; 1993, Vol. 40 Issue 4, p712-720, 9p
Publication Year :
1993

Details

Language :
English
ISSN :
00189383
Volume :
40
Issue :
4
Database :
Complementary Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
93118924
Full Text :
https://doi.org/10.1109/16.202782