Design of bipolar imaging devices (BASIS): analysis of random noise.

MLA

Nakamura, Y., et al. “Design of Bipolar Imaging Devices (BASIS): Analysis of Random Noise.” IEEE Transactions on Electron Devices, vol. 39, no. 6, Jan. 1992, pp. 1341–49. EBSCOhost, https://doi.org/10.1109/16.137313.

APA

Nakamura, Y., Ohzu, H., Miyawaki, M., Ishizaki, A., Kochi, T., & Ohmi, T. (1992). Design of bipolar imaging devices (BASIS): analysis of random noise. IEEE Transactions on Electron Devices, 39(6), 1341–1349. https://doi.org/10.1109/16.137313

Chicago

Nakamura, Y., H. Ohzu, M. Miyawaki, A. Ishizaki, T. Kochi, and T. Ohmi. 1992. “Design of Bipolar Imaging Devices (BASIS): Analysis of Random Noise.” IEEE Transactions on Electron Devices 39 (6): 1341–49. doi:10.1109/16.137313.