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Design of bipolar imaging devices (BASIS): analysis of random noise.

Authors :
Nakamura, Y.
Ohzu, H.
Miyawaki, M.
Ishizaki, A.
Kochi, T.
Ohmi, T.
Source :
IEEE Transactions on Electron Devices; 1992, Vol. 39 Issue 6, p1341-1349, 9p
Publication Year :
1992

Details

Language :
English
ISSN :
00189383
Volume :
39
Issue :
6
Database :
Complementary Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
93118531
Full Text :
https://doi.org/10.1109/16.137313