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High-speed BiCMOS technology with a buried twin well structure.

Authors :
Ikeda, T.
Watanabe, A.
Nishio, Y.
Masuda, I.
Tamba, N.
Odaka, M.
Ogiue, K.
Source :
IEEE Transactions on Electron Devices; 1987, Vol. 34 Issue 6, p1304-1310, 7p
Publication Year :
1987

Details

Language :
English
ISSN :
00189383
Volume :
34
Issue :
6
Database :
Complementary Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
93116253
Full Text :
https://doi.org/10.1109/T-ED.1987.23085