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Effects of insulator thickness fluctuations on MNOS charge storage characteristics.
- Source :
- IEEE Transactions on Electron Devices; 1972, Vol. 19 Issue 2, p198-204, 7p
- Publication Year :
- 1972
Details
- Language :
- English
- ISSN :
- 00189383
- Volume :
- 19
- Issue :
- 2
- Database :
- Complementary Index
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- 93110568
- Full Text :
- https://doi.org/10.1109/T-ED.1972.17397