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An interpretation of tunneling time.

Authors :
Campi, M.
Cohen, M.M.
Source :
IEEE Transactions on Electron Devices; 1970, Vol. 17 Issue 2, p157-159, 3p
Publication Year :
1970

Details

Language :
English
ISSN :
00189383
Volume :
17
Issue :
2
Database :
Complementary Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
93110112
Full Text :
https://doi.org/10.1109/T-ED.1970.16941