Improved test methodology for multi-clock domain SoC ATPG testing.

Details

Language :

English

ISBNs :

9781479913145

Database :

Complementary Index

Journal :

2013 5th Asia Symposium on Quality Electronic Design (ASQED)

Publication Type :

Conference

Accession number :

92930786

Full Text :

https://doi.org/10.1109/ASQED.2013.6643560