Test pattern generation for static burn-in based on equivalent fault model.

Authors :: Xiaole Cui
Zhengyu Qian
Xinming Shi
Chung-Len Lee
Source :: 2013 IEEE International Conference of Electron Devices & Solid-state Circuits; 2013, p1-2, 2p
Publication Year :: 2013

Language :: English
ISBNs :: 9781467325233
Database :: Complementary Index
Journal :: 2013 IEEE International Conference of Electron Devices & Solid-state Circuits
Publication Type :: Conference
Accession number :: 92928113
Full Text :: https://doi.org/10.1109/EDSSC.2013.6628079