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Analysis of CMOS 0.13µm test structures for 0.6 to 1.5 THz imaging.
- Source :
- 2013 38th International Conference on Infrared, Millimeter & Terahertz Waves (IRMMW-THz); 2013, p1-2, 2p
- Publication Year :
- 2013
Details
- Language :
- English
- ISBNs :
- 9781467347174
- Database :
- Complementary Index
- Journal :
- 2013 38th International Conference on Infrared, Millimeter & Terahertz Waves (IRMMW-THz)
- Publication Type :
- Conference
- Accession number :
- 92925213
- Full Text :
- https://doi.org/10.1109/IRMMW-THz.2013.6665619