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Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps.

Authors :
Ruth, Scott
Miller, James W.
Gerdemann, Alex
Stockinger, Michael
Etherton, Melanie
Moosa, Mohamed
Dobbin, Allan
Mertens, Robert
Meng, Kuo-Hsuan
Rosenbaum, Elyse
Colombo, Paolo
Cordoni, Martina
Guitard, Nicolas
Source :
2013 35th Electrical Overstress/Electrostatic Discharge Symposium; 2013, p1-10, 10p
Publication Year :
2013

Details

Language :
English
ISBNs :
9781585372324
Database :
Complementary Index
Journal :
2013 35th Electrical Overstress/Electrostatic Discharge Symposium
Publication Type :
Conference
Accession number :
92910940

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