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NASA B-757 HIRF test series low power on-the-ground tests.
- Source :
- IEEE Aerospace & Electronic Systems; 1996, Vol. 11 Issue 4, p27-33, 7p
- Publication Year :
- 1996
Details
- Language :
- English
- ISSN :
- 08858985
- Volume :
- 11
- Issue :
- 4
- Database :
- Complementary Index
- Journal :
- IEEE Aerospace & Electronic Systems
- Publication Type :
- Academic Journal
- Accession number :
- 92831988
- Full Text :
- https://doi.org/10.1109/62.490221