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NASA B-757 HIRF test series low power on-the-ground tests.

Authors :
Poggio, A.J.
Zacharias, R.A.
Pennock, S.T.
Avalle, C.A.
Carney, H.
Source :
IEEE Aerospace & Electronic Systems; 1996, Vol. 11 Issue 4, p27-33, 7p
Publication Year :
1996

Details

Language :
English
ISSN :
08858985
Volume :
11
Issue :
4
Database :
Complementary Index
Journal :
IEEE Aerospace & Electronic Systems
Publication Type :
Academic Journal
Accession number :
92831988
Full Text :
https://doi.org/10.1109/62.490221