Back to Search
Start Over
A compact thermal noise model for the investigation of soft error rates in MOS VLSI digital circuits.
- Source :
- IEEE Journal of Solid-State Circuits; 1989, Vol. 24 Issue 1, p79-89, 11p
- Publication Year :
- 1989
Details
- Language :
- English
- ISSN :
- 00189200
- Volume :
- 24
- Issue :
- 1
- Database :
- Complementary Index
- Journal :
- IEEE Journal of Solid-State Circuits
- Publication Type :
- Academic Journal
- Accession number :
- 92812077
- Full Text :
- https://doi.org/10.1109/4.16305