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A new 'shift and ratio' method for MOSFET channel-length extraction.

Authors :
Taur, Y.
Zicherman, D.S.
Lombardi, D.R.
Restle, P.J.
Hsu, C.H.
Nanafi, H.I.
Wordeman, M.R.
Davari, B.
Shahidi, G.G.
Source :
IEEE Electron Device Letters; 1992, Vol. 13 Issue 5, p267-269, 3p
Publication Year :
1992

Details

Language :
English
ISSN :
07413106
Volume :
13
Issue :
5
Database :
Complementary Index
Journal :
IEEE Electron Device Letters
Publication Type :
Academic Journal
Accession number :
92795419
Full Text :
https://doi.org/10.1109/55.145049