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A Josephson technology system level experiment.

Authors :
Ketchen, M.B.
van der Hoeven, B.J.
Matisoo, J.
Greiner, J.H.
Herrell, D.J.
Wang, R.H.
Guernsey, R.W.
Anderson, C.J.
Arnett, P.C.
Bermon, S.
Bickford, H.R.
Bright, A.A.
Geldermans, P.
Gheewala, T.R.
Grebe, K.R.
Jones, H.C.
Klein, M.
Klepner, S.P.
Moskowitz, P.A.
Natan, M.
Source :
IEEE Electron Device Letters; 1981, Vol. 2 Issue 10, p262-265, 4p
Publication Year :
1981

Details

Language :
English
ISSN :
07413106
Volume :
2
Issue :
10
Database :
Complementary Index
Journal :
IEEE Electron Device Letters
Publication Type :
Academic Journal
Accession number :
92793221
Full Text :
https://doi.org/10.1109/EDL.1981.25426
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