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0.5-/spl mu/m-pitch copper-dual-damascene metallization using organic SOG (k=2.9) for 0.18-/spl mu/m CMOS applications.
- Source :
- International Electron Devices Meeting 1999 Technical Digest (Cat No99CH36318); 1999, p619-622, 4p
- Publication Year :
- 1999
Details
- Language :
- English
- ISBNs :
- 9780780354104
- Database :
- Complementary Index
- Journal :
- International Electron Devices Meeting 1999 Technical Digest (Cat No99CH36318)
- Publication Type :
- Conference
- Accession number :
- 92555820
- Full Text :
- https://doi.org/10.1109/IEDM.1999.824229