Testing VLSI circuits from VHDL descriptions.

Authors :: Riesgo, T.
Torroja, Y.
de la Torre, E.
Uceda, J.
Source :: Proceedings of the 1992 International Conference on Industrial Electronics, Control, Instrumentation & Automation; 1992, p1052-1052, 1p
Publication Year :: 1992

Language :: English
ISBNs :: 9780780305823
Database :: Complementary Index
Journal :: Proceedings of the 1992 International Conference on Industrial Electronics, Control, Instrumentation & Automation
Publication Type :: Conference
Accession number :: 92498864
Full Text :: https://doi.org/10.1109/IECON.1992.254467