Fault location in passive analog RC circuits by measuring impulse response.

Details

Language :

English

ISBNs :

9780780327863

Issue :

2

Database :

Complementary Index

Journal :

Proceedings of International Conference on Microelectronics

Publication Type :

Conference

Accession number :

92492084

Full Text :

https://doi.org/10.1109/ICMEL.1995.500920