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Photoemission characteristics of reverse-breakdown n/sup +/-diodes with LOCOS- and trench-isolation.

Authors :
Ohzone, T.
Iwata, H.
Source :
ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures; 1993, p177-182, 6p
Publication Year :
1993

Details

Language :
English
ISBNs :
9780780308572
Database :
Complementary Index
Journal :
ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures
Publication Type :
Conference
Accession number :
92473907
Full Text :
https://doi.org/10.1109/ICMTS.1993.292924
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