A new analysis technique for the sensitivity of chip performance.

MLA

Sang-Hoon Lee, et al. “A New Analysis Technique for the Sensitivity of Chip Performance.” ICVC ’99 6th International Conference on VLSI & CAD (Cat No99EX361), Jan. 1999, pp. 61–64. EBSCOhost, https://doi.org/10.1109/ICVC.1999.820823.

APA

Sang-Hoon Lee, Dong-Yun Lee, Jin-Yang Kim, Young-Jin Gu, Young-Kwan Park, & Jeong-Taek Kong. (1999). A new analysis technique for the sensitivity of chip performance. ICVC ’99 6th International Conference on VLSI & CAD (Cat No99EX361), 61–64. https://doi.org/10.1109/ICVC.1999.820823

Chicago

Sang-Hoon Lee, Dong-Yun Lee, Jin-Yang Kim, Young-Jin Gu, Young-Kwan Park, and Jeong-Taek Kong. 1999. “A New Analysis Technique for the Sensitivity of Chip Performance.” ICVC ’99 6th International Conference on VLSI & CAD (Cat No99EX361), January, 61–64. doi:10.1109/ICVC.1999.820823.