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0.5 μm CMOS Device Design and Characterization.

Authors :
Hanafi, H. I.
Wordeman, M. R.
Wang, L. K.
Taur, Y.
Sun, J. Y. C.
Dennard, R. H.
Zicherman, D. S.
Rodriguez, M. D.
Haddad, N.
Edenfeld, A.
Polavarapu, M.
Source :
ESSDERC '87: 17th European Solid State Device Research Conference; 1987, p91-94, 4p
Publication Year :
1987

Details

Language :
English
ISBNs :
9780444704771
Database :
Complementary Index
Journal :
ESSDERC '87: 17th European Solid State Device Research Conference
Publication Type :
Conference
Accession number :
92388410