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Studies of interface phenomena at silicon grain boundaries.

Authors :
Card, H.C.
De Groot, A.W.
McGonigal, G.C.
J. G. Shaw
Thomson, D.J.
Source :
1983 International Electron Devices Meeting; 1983, p198-201, 4p
Publication Year :
1983

Details

Language :
English
Database :
Complementary Index
Journal :
1983 International Electron Devices Meeting
Publication Type :
Conference
Accession number :
92384457
Full Text :
https://doi.org/10.1109/IEDM.1983.190475
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