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Radiation-hard 16K CMOS/SOS clocked static RAM.

Authors :
Gupta, A.
Li, M.F.
Yu, K.K.
Su, S.C.
Pandya, P.
Yang, H.B.
Source :
1981 International Electron Devices Meeting; 1981, p616-619, 4p
Publication Year :
1981

Details

Language :
English
Database :
Complementary Index
Journal :
1981 International Electron Devices Meeting
Publication Type :
Conference
Accession number :
92381363
Full Text :
https://doi.org/10.1109/IEDM.1981.190160