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Using neural networks and 3D polynomial interpolation for the study of probe yield vs. E-test correlation. Application to sub-micronics mixed-signal technology.
- Source :
- 10th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference & Workshop ASMC 99 Proceedings (Cat No99CH36295); 1999, p197-201, 5p
- Publication Year :
- 1999
Details
- Language :
- English
- ISBNs :
- 9780780352179
- Database :
- Complementary Index
- Journal :
- 10th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference & Workshop ASMC 99 Proceedings (Cat No99CH36295)
- Publication Type :
- Conference
- Accession number :
- 92366360
- Full Text :
- https://doi.org/10.1109/ASMC.1999.798222