Using neural networks and 3D polynomial interpolation for the study of probe yield vs. E-test correlation. Application to sub-micronics mixed-signal technology.

Details

Language :

English

ISBNs :

9780780352179

Database :

Complementary Index

Journal :

10th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference & Workshop ASMC 99 Proceedings (Cat No99CH36295)

Publication Type :

Conference

Accession number :

92366360

Full Text :

https://doi.org/10.1109/ASMC.1999.798222