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Importance of top insulator quality for the stability of a-Si thin film transistors.
- Source :
- Technical Digest, International Electron Devices Meeting; 1988, p272-275, 4p
- Publication Year :
- 1988
Details
- Language :
- English
- Database :
- Complementary Index
- Journal :
- Technical Digest, International Electron Devices Meeting
- Publication Type :
- Conference
- Accession number :
- 92359017
- Full Text :
- https://doi.org/10.1109/IEDM.1988.32809