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A 42.5 mm/sup 2/ 1 Mb nonvolatile ferroelectric memory utilizing advanced architecture for enhanced reliability.

Authors :
Kraus, W.
Lehman, L.
Wilson, D.
Yamazaki, T.
Ohno, C.
Nagai, E.
Yamazaki, H.
Suzuki, H.
Source :
Seventh Biennial IEEE International Nonvolatile Memory Technology Conference Proceedings (Cat No98EX141); 1998, p22-25, 4p
Publication Year :
1998

Details

Language :
English
ISBNs :
9780780345188
Database :
Complementary Index
Journal :
Seventh Biennial IEEE International Nonvolatile Memory Technology Conference Proceedings (Cat No98EX141)
Publication Type :
Conference
Accession number :
92349614
Full Text :
https://doi.org/10.1109/NVMT.1998.723210