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High yield multichip modules based on minimal IC pretest.
- Source :
- Proceedings, International Test Conference; 1994, p30-40, 11p
- Publication Year :
- 1994
Details
- Language :
- English
- ISBNs :
- 9780780321038
- Database :
- Complementary Index
- Journal :
- Proceedings, International Test Conference
- Publication Type :
- Conference
- Accession number :
- 92344959
- Full Text :
- https://doi.org/10.1109/TEST.1994.527933