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A damage integral approach to thermal fatigue of solder joints.

Authors :
Subrahmanyan, R.
Wilcox, J.R.
Li, C.-Y.
Source :
Proceedings, 39th Electronic Components Conference; 1989, p240-252, 13p
Publication Year :
1989

Details

Language :
English
Database :
Complementary Index
Journal :
Proceedings, 39th Electronic Components Conference
Publication Type :
Conference
Accession number :
92343324
Full Text :
https://doi.org/10.1109/ECC.1989.77757