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Accurate modeling of capacitive, resistive and inductive effects of interconnect.

Authors :
Ching-Chao Huang
Jue-Hsien Chern
Source :
Proceedings of WESCON '95; 1995, p115-115, 1p
Publication Year :
1995

Details

Language :
English
ISBNs :
9780780326361
Database :
Complementary Index
Journal :
Proceedings of WESCON '95
Publication Type :
Conference
Accession number :
92332056
Full Text :
https://doi.org/10.1109/WESCON.1995.485262