Dynamic single event effects in a CMOS/thick SOI shift register.

Authors :: Gardic, F.
Flament, O.
Musseau, O.
Brisset, C.
Martinez, M.
Brunet, J.P.
Blanquart, L.
Source :: Proceedings of the Third European Conference on Radiation & its Effects on Components & Systems; 1996, p333-339, 7p
Publication Year :: 1996

Language :: English
ISBNs :: 9780780330931
Database :: Complementary Index
Journal :: Proceedings of the Third European Conference on Radiation & its Effects on Components & Systems
Publication Type :: Conference
Accession number :: 92326595
Full Text :: https://doi.org/10.1109/RADECS.1995.509799