Efficient scan-path and BIST latches for static CMOS ASIC circuits.

Details

Language :

English

ISBNs :

9780780300811

Database :

Complementary Index

Journal :

Proceedings of the 33rd Midwest Symposium on Circuits & Systems

Publication Type :

Conference

Accession number :

92307472

Full Text :

https://doi.org/10.1109/MWSCAS.1990.140784