BIST with negligible aliasing through random cover circuits.

Details

Language :

English

ISBNs :

9784930813671

Database :

Complementary Index

Journal :

Proceedings of ASP-DAC'95/CHDL'95/VLSI'95 with EDA Technofair

Publication Type :

Conference

Accession number :

92292808

Full Text :

https://doi.org/10.1109/ASPDAC.1995.486227