Device reliability and optimization on halo MOSFETs.

Authors :: Duheon Song
Junhee Lim
Kyungho Lee
Source :: Proceedings of 1995 IEEE International Reliability Physics Symposium; 1995, p271-275, 5p
Publication Year :: 1995

Language :: English
ISBNs :: 9780780320314
Database :: Complementary Index
Journal :: Proceedings of 1995 IEEE International Reliability Physics Symposium
Publication Type :: Conference
Accession number :: 92275451
Full Text :: https://doi.org/10.1109/RELPHY.1995.513691